Auto recovery from volatile soft error upsets (SEUs)
作者： Tou Nou Thao , Ann Wu , San-Ta Kow
DOI:
关键词:
摘要: A method of recovering from a soft error within configuration data stored in configured programmable logic device. The includes repeatedly processing the memory device using an error-detection algorithm to generate checksum. generated checksum is compared with previously detect if exists data. If detected, initiates reconfiguration memory. then reconfigured while preventing responding as though was initial An embodiment designed for practicing also disclosed.
lens.org 参考文章(28)
Ramesh C. Varshney, Test system for segmented memory ,(1980)
Kapil Shankar, Om P. Agrawal, Arthur H. Khu, Integrated circuit programmable sequencing element apparatus ,(1993)
Kevin A. Norman, Programmable integrated circuit micro-sequencer device ,(1987)
William C. Plants, Cyclic redundancy checking of a field programmable gate array having an SRAM memory architecture ,(2000)
Jeffrey Byrne, Mark Moyer, Continuous self-verify of configuration memory in programmable logic devices ,(2003)
Timothy John Slegel, Pradip Patel, Tin-Chee Lo, William Vincent Huott, Programmable computer system element with built-in self test method and apparatus for repair during power-on ,(1995)
John Robert McDonald, John Lowell Zeller, Thomas Scott Gee, Nonvolatile memory implementation for electronic devices ,(1999)
Parvesh Swami, Shalini Pathak, A method and device for testing of configuration memory cells in programmable logic devices (PLDS) ,(2003)
Austin H. Lesea, Integrated testing of serializer/deserializer in fpga ,(2002)
Tord Lennart Haulin, A fault tolerant queue system ,(1994)