Compositional dependence of the strain-free optical band gap in InxGa1−xN layers

作者: S. Pereira , M. R. Correia , T. Monteiro , E. Pereira , E. Alves

DOI: 10.1063/1.1358368

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摘要: The effect of strain on the compositional and optical properties a set epitaxial single layers InxGa1−xN was studied. Indium content measured free from effects by Rutherford backscattering spectrometry. Accurate knowledge In mole fraction, combined with x-ray diffraction measurements, allows perpendicular (ezz) to be evaluated. Optical band gaps were determined absorption spectroscopy corrected for strain. Following this approach, dependence gap in alloys x⩽0.25. Our results indicate an “anomalous,” linear, energy content, at room temperature: Eg(x)=3.39–3.57x eV. Extension behavior higher concentrations is discussed basis reported results.

参考文章(32)
L. T. Romano, B. S. Krusor, M. D. McCluskey, D. P. Bour, K. Nauka, Structural and optical properties of pseudomorphic InxGa1−xN alloys Applied Physics Letters. ,vol. 73, pp. 1757- 1759 ,(1998) , 10.1063/1.122272
C. A. Parker, J. C. Roberts, S. M. Bedair, M. J. Reed, S. X. Liu, N. A. El-Masry, L. H. Robins, Optical band gap dependence on composition and thickness of InxGa1−xN (0<x<0.25) grown on GaN Applied Physics Letters. ,vol. 75, pp. 2566- 2568 ,(1999) , 10.1063/1.125079
M. D. McCluskey, C. G. Van de Walle, C. P. Master, L. T. Romano, N. M. Johnson, LARGE BAND GAP BOWING OF INXGA1-XN ALLOYS Applied Physics Letters. ,vol. 72, pp. 2725- 2726 ,(1998) , 10.1063/1.121072
C. Wetzel, T. Takeuchi, S. Yamaguchi, H. Katoh, H. Amano, I. Akasaki, Optical band gap in Ga1−xInxN (0<x<0.2) on GaN by photoreflection spectroscopy Applied Physics Letters. ,vol. 73, pp. 1994- 1996 ,(1998) , 10.1063/1.122346
J.W. Matthews, A.E. Blakeslee, Defects in epitaxial multilayers Journal of Crystal Growth. ,vol. 32, pp. 265- 273 ,(1976) , 10.1016/0022-0248(76)90041-5
H. P. D. Schenk, P. de Mierry, M. Laügt, F. Omnès, M. Leroux, B. Beaumont, P. Gibart, Indium incorporation above 800 °C during metalorganic vapor phase epitaxy of InGaN Applied Physics Letters. ,vol. 75, pp. 2587- 2589 ,(1999) , 10.1063/1.125086
M. F. Wu, A. Vantomme, S. M. Hogg, G. Langouche, W. Van der Stricht, K. Jacobs, I. Moerman, Elastic strain in In0.18Ga0.82N layer: A combined x-ray diffraction and Rutherford backscattering/channeling study Applied Physics Letters. ,vol. 74, pp. 365- 367 ,(1999) , 10.1063/1.123032
L. Nowicki, R. Ratajczak, A. Stonert, A. Turos, J.M. Baranowski, R. Banasik, K. Pakuła, Characterization of InGaN/GaN heterostructures by means of RBS/channeling Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms. ,vol. 161, pp. 539- 543 ,(2000) , 10.1016/S0168-583X(99)00840-X
L. Bellaiche, T. Mattila, L.-W. Wang, S.-H. Wei, A. Zunger, Resonant hole localization and anomalous optical bowing in InGaN alloys Applied Physics Letters. ,vol. 74, pp. 1842- 1844 ,(1999) , 10.1063/1.123687
Lawrence R. Doolittle, Algorithms for the rapid simulation of Rutherford backscattering spectra Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. ,vol. 9, pp. 344- 351 ,(1985) , 10.1016/0168-583X(85)90762-1