Dissociation and evolution of threading dislocations in epitaxial Ba0.3Sr0.7TiO3 thin films grown on (001) LaAlO3
作者： C. J. Lu , L. A. Bendersky , K. Chang , I. Takeuchi
DOI: 10.1063/1.1524315
关键词:
摘要: The defect structure of a 350-nm-thick epitaxial Ba0.3Sr0.7TiO3 (BSTO) film grown on (001) LaAlO3 has been investigated using conventional and high-resolution transmission electron microscopy. dominant defects in the are edge-type threading dislocations (TDs) with Burgers vectors b=〈100〉 〈110〉. Pure-screw TDs partial mixed character were also observed. A rapid reduction density occurred after growth first 100 nm BSTO adjacent to interface. In top layer film, all perfect while those b=〈110〉 usually dissociated into two partials small separation (a few nanometers). However, near-interface many split or three partials. high extended stacking faults displacement 12〈110〉 type associated half loops. mechanisms for generation, dissociation ev...
scitation.org
harvard.edu
aip.org
sci-hub.se 参考文章(36)
S. Hyun, J. H. Lee, S. S. Kim, K. Char, S. J. Park, J. Sok, E. H. Lee, Anisotropic tuning behavior in epitaxial Ba0.5Sr0.5TiO3 thin films Applied Physics Letters. ,vol. 77, pp. 3084- 3086 ,(2000) , 10.1063/1.1323996
C. J. Lu, Z. L. Wang, C. Kwon, Q. X. Jia, Microstructure of epitaxial La0.7Ca0.3MnO3 thin films grown on LaAlO3 and SrTiO3 Journal of Applied Physics. ,vol. 88, pp. 4032- 4043 ,(2000) , 10.1063/1.1290741
Howard F. McMurdie, Ernest M. Levin, Carl R. Robbins, Margie K. Reser, Phase diagrams for ceramists Published in <b>1964</b> - <b>1959</b> in Columbus Ohio) by American ceramic society. ,(1964)
K. S. Chang, M. Aronova, O. Famodu, I. Takeuchi, S. E. Lofland, J. Hattrick-Simpers, H. Chang, Multimode quantitative scanning microwave microscopy of in situ grown epitaxial Ba 1-x Sr x TiO 3 composition spreads Applied Physics Letters. ,vol. 79, pp. 4411- 4413 ,(2001) , 10.1063/1.1427438
Jaemo Im, O. Auciello, P. K. Baumann, S. K. Streiffer, D. Y. Kaufman, A. R. Krauss, Composition-control of magnetron-sputter-deposited (BaxSr1−x)Ti1+yO3+z thin films for voltage tunable devices Applied Physics Letters. ,vol. 76, pp. 625- 627 ,(2000) , 10.1063/1.125839
C. J. Lu, Z. L. Wang, G. C. Xiong, G. J. Lian, Layered microdomains and columnar grains in epitaxial La0.7Ca0.3MnO3 films and Y0.7Ca0.3MnO3/La0.7Ca0.3MnO3 multilayers Journal of Materials Research. ,vol. 15, pp. 2454- 2462 ,(2000) , 10.1557/JMR.2000.0352
Pratibha L. Gai, Kostantinos Kourtakis, D. Robert Coulson, George C. Sonnichsen, HREM Microstructural Studies on the Effect of Steam Exposure and Cation Promoters on Vanadium Phosphorus Oxides: New Correlations with n-Butane Oxidation Reaction Chemistry Journal of Physical Chemistry B. ,vol. 101, pp. 9916- 9925 ,(1997) , 10.1021/JP971683G
Z. Mao, K. M. Knowles, Dissociation of lattice dislocations in SrTiO3 Philosophical Magazine. ,vol. 73, pp. 699- 708 ,(1996) , 10.1080/01418619608242991
Masami Tachikawa, Masafumi Yamaguchi, Film thickness dependence of dislocation density reduction in GaAs‐on‐Si substrates Applied Physics Letters. ,vol. 56, pp. 484- 486 ,(1990) , 10.1063/1.102773
P. Sheldon, K. M. Jones, M. M. Al‐Jassim, B. G. Yacobi, Dislocation density reduction through annihilation in lattice-mismatched semiconductors grown by molecular-beam epitaxy Journal of Applied Physics. ,vol. 63, pp. 5609- 5611 ,(1988) , 10.1063/1.340343