Multimode quantitative scanning microwave microscopy of in situ grown epitaxial Ba 1-x Sr x TiO 3 composition spreads
作者： K. S. Chang , M. Aronova , O. Famodu , I. Takeuchi , S. E. Lofland
DOI: 10.1063/1.1427438
关键词: Dielectric 、 Materials science 、 Analytical chemistry 、 Microscopy 、 Scanning probe microscopy 、 Microwave 、 Epitaxy 、 Multi-mode optical fiber 、 Relaxation (NMR) 、 Microscope
摘要: We have performed variable-temperature multimode quantitative microwave microscopy of in situ epitaxial Ba1−xSrxTiO3 thin-film composition spreads fabricated on (100) LaA1O3 substrates. Dielectric properties were mapped as a function continuously varying from BaTiO3 to SrTiO3. demonstrated nondestructive temperature-dependent dielectric characterization local regions. Measurements are simultaneously taken at multiple resonant frequencies the microscope cavity. The measurements allow frequency dispersion studies. observe strong composition-dependent relaxation frequencies.
harvard.edu
scitation.org
aip.org
sci-hub.se 参考文章(24)
Y. Gim, T. Hudson, Y. Fan, C. Kwon, A. T. Findikoglu, B. J. Gibbons, B. H. Park, Q. X. Jia, Microstructure and dielectric properties of Ba1−xSrxTiO3 films grown on LaAlO3 substrates Applied Physics Letters. ,vol. 77, pp. 1200- 1202 ,(2000) , 10.1063/1.1289272
H. Chang, I. Takeuchi, X.-D. Xiang, A low-loss composition region identified from a thin-film composition spread of (Ba1−x−ySrxCay)TiO3 Applied Physics Letters. ,vol. 74, pp. 1165- 1167 ,(1999) , 10.1063/1.123475
Y. G. Wang, M. E. Reeves, W. J. Kim, J. S. Horwitz, F. J. Rachford, Uniaxial dielectric anisotropy in Ba0.5Sr0.5TiO3 films studied by evanescent-probe microscopy Applied Physics Letters. ,vol. 78, pp. 3872- 3874 ,(2001) , 10.1063/1.1377628
I. Takeuchi, T. Wei, Fred Duewer, Y. K. Yoo, X.-D. Xiang, V. Talyansky, S. P. Pai, G. J. Chen, T. Venkatesan, Low temperature scanning-tip microwave near-field microscopy of YBa2Cu3O7−x films Applied Physics Letters. ,vol. 71, pp. 2026- 2028 ,(1997) , 10.1063/1.119776
Yalin Lu, Tao Wei, Fred Duewer, Yanqing Lu, Nai-Ben Ming, PG Schultz, X-D Xiang, Nondestructive Imaging of Dielectric-Constant Profiles and Ferroelectric Domains with a Scanning-Tip Microwave Near-Field Microscope Science. ,vol. 276, pp. 2004- 2006 ,(1997) , 10.1126/SCIENCE.276.5321.2004
A. F. Lann, M. Golosovsky, D. Davidov, A. Frenkel, Combined millimeter-wave near-field microscope and capacitance distance control for the quantitative mapping of sheet resistance of conducting layers Applied Physics Letters. ,vol. 73, pp. 2832- 2834 ,(1998) , 10.1063/1.122605
Charles Hubert, Jeremy Levy, E. J. Cukauskas, Steven W. Kirchoefer, Mesoscopic microwave dispersion in ferroelectric thin films Physical Review Letters. ,vol. 85, pp. 1998- 2001 ,(2000) , 10.1103/PHYSREVLETT.85.1998
M. J. Dalberth, R. E. Stauber, J. C. Price, C. T. Rogers, David Galt, Improved low frequency and microwave dielectric response in strontium titanate thin films grown by pulsed laser ablation Applied Physics Letters. ,vol. 72, pp. 507- 509 ,(1998) , 10.1063/1.120799
J. H. Lee, S. Hyun, K. Char, Quantitative analysis of scanning microwave microscopy on dielectric thin film by finite element calculation Review of Scientific Instruments. ,vol. 72, pp. 1425- 1434 ,(2001) , 10.1063/1.1342032
C. Gao, X.-D. Xiang, Quantitative microwave near-field microscopy of dielectric properties Review of Scientific Instruments. ,vol. 69, pp. 3846- 3851 ,(1998) , 10.1063/1.1149189