Polarization sensitivity of a silica waveguide thermooptic phase shifter for planar lightwave circuits

作者: Y. Inoue , K. Katoh , M. Kawachi

DOI: 10.1109/68.124868

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摘要: A thermooptic (TO) phase shifter, which consists of a thin-film heater loaded on silica-based single-mode waveguide Si substrate, was found to exhibit sli1h,t polarization dependence about 3.1% between the TE and TM modes. This dependence, is caused by anisotropic stress concentration due local heating, successfully reduced forming stress-releasing grooves either side heater. >

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