Effect of Annealing on the Properties of ZnxCd1-xS Thin Film Growth by RF Magnetron Co-sputtering
作者： M.S. Hossain , M.A. Islam , M.M. Aliyu , P. Chelvanathan , T. Razykov
DOI: 10.1016/J.EGYPRO.2013.05.060
关键词:
摘要: Abstract Zn x Cd 1-x S thin films at low zinc content have been deposited on bare soda lime glass substrates using RF magnetron co-sputtering of CdS and ZnS for the first time to investigate annealing effect structural optical properties films. The as-deposited were annealed in O 2 /N ambient temperature ranging 200-500 °C. composition was controlled by varying power such a ratio so that low. composition, structural, surface morphological investigated EDX, XRD, UV-Vis spectrophotometer FESEM. observed hexagonal wurtzite structure with strong preferential orientation along (002) diffraction peak. Crystallinity increased increasing below 400 °C whereas beyond new peaks decreasing trend Optical absorption transmission spectra recorded within range 300-900 nm. With temperature, band gap once decreased then abruptly around 400 °C. bandgap may due possible increase crystalline nature material. From SEM, it formed different clusters grains which later changed isolated as increased. This work confirms has overbearing influence film co-sputtering.
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