作者: Yanling Lu , Jun Wang , Yang Yang , Yongbing Dai , Baode Sun
DOI: 10.1016/J.JCRYSGRO.2006.04.040
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摘要: Abstract The Czochralski growth of Tm:yttrium aluminate (YAP) crystal (10 at%) has been presented. as-grown investigated by X-ray diffraction (XRD) method using its powder sample, which showed that only YAP phase existed and there was no TmAlO3 in the crystal. rocking curve (XRC) determined, full-width at half-maximum (FWHM ) is 31.5″. absorption fluorescence spectra Tm:YAP with different Tm concentration were measured. Though intensity 10 at% much bigger, smaller. Some “hidden defects” like core striations could not be observed naked eyes microscope, but they determined synchrotron radiation white-beam topography (SRWBT) technique.