Nanoscale investigation of fatigue effects in Pb(Zr,Ti)O3 films
作者： A. Gruverman , O. Auciello , H. Tokumoto
DOI: 10.1063/1.117957
关键词:
摘要: Scanning force microscopy has been used to perform a comparative nanoscale study of domain structures and switching behavior of Pb(Zr x Ti 1−x )O 3 (PZT) thin films integrated into …
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sci-hub.se 参考文章(1)
Science and technology of electroceramic thin films Kluwer Academic. ,(1995) , 10.1007/978-94-017-2950-5