Use of deep-level transitions in semiconductor devices

作者: Janet L. Pan

DOI:

关键词:

摘要: The invention relates to the design, fabrication, and use of semiconductor devices that employ deep-level transitions (i.e., deep-level-to-conduction-band, deep-level-to-valence-band, or deep-level-to-deep-level) achieve useful results. A principal aspect involves in which electrical transport occurs through a band states just conduction (or valence band), but where significant current does not flow all three bands. This means deep-state is acting as nonradiative trap, rather an energy takes place. Advantageously, energy-band may facilitate radiative transition, either upper lower state optical transition.

参考文章(42)
G. A. Baraff, M. A. Schluter, Electronic aspects of the optical-absorption spectrum of the EL2 defect in GaAs. Physical Review B. ,vol. 45, pp. 8300- 8309 ,(1992) , 10.1103/PHYSREVB.45.8300
D. E. Bliss, W. Walukiewicz, J. W. Ager, E. E. Haller, K. T. Chan, S. Tanigawa, Annealing studies of low-temperature-grown GaAs:Be Journal of Applied Physics. ,vol. 71, pp. 1699- 1707 ,(1992) , 10.1063/1.351200
M. Kamińska, M. Skowroński, W. Kuszko, Identification of the 0.82-eV electron trap, EL2 in GaAs, as an isolated antisite arsenic defect. Physical Review Letters. ,vol. 55, pp. 2204- 2207 ,(1985) , 10.1103/PHYSREVLETT.55.2204
R. Enrique Viturro, Michael R. Melloch, Jerry M. Woodall, Optical emission properties of semi‐insulating GaAs grown at low temperatures by molecular beam epitaxy Applied Physics Letters. ,vol. 60, pp. 3007- 3009 ,(1992) , 10.1063/1.106791
R. M. Feenstra, J. M. Woodall, G. D. Pettit, Observation of bulk defects by scanning tunneling microscopy and spectroscopy: Arsenic antisite defects in GaAs. Physical Review Letters. ,vol. 71, pp. 1176- 1179 ,(1993) , 10.1103/PHYSREVLETT.71.1176
Evan O. Kane, Band structure of indium antimonide Journal of Physics and Chemistry of Solids. ,vol. 1, pp. 249- 261 ,(1957) , 10.1016/0022-3697(57)90013-6
B. Grandidier, Huajie Chen, R. M. Feenstra, D. T. McInturff, P. W. Juodawlkis, S. E. Ralph, Scanning tunneling microscopy and spectroscopy of arsenic antisites in low temperature grown InGaAs Applied Physics Letters. ,vol. 74, pp. 1439- 1441 ,(1999) , 10.1063/1.123575
U Siegner, M Haiml, F Morier-Genoud, R.C Lutz, P Specht, E.R Weber, U Keller, Femtosecond nonlinear optics of low-temperature grown semiconductors Physica B-condensed Matter. ,vol. 273, pp. 733- 736 ,(1999) , 10.1016/S0921-4526(99)00625-0
Janet L. Pan, Analytical method for finding the general optical properties of semiconductor deep centers Journal of Applied Physics. ,vol. 92, pp. 5991- 6004 ,(2002) , 10.1063/1.1513193