Modifizierung von SiO2‐Oberflächen mit Hilfe von Plasmen Teil I — EPR‐spektroskopische Untersuchung der Defektzentren und der Einfluß des Plasmaträgergases auf deren Bildung
作者： Klaus Meyer , Hans-Jürgen Tiller , Elisabeth Welz , Wolfgang Kühn
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sci-hub.se 参考文章(30)
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