作者: Tao Zhang , Kiyotaka Wasa , Shu-yi Zhang , Zhao-jiang Chen , Feng-mei Zhou
DOI: 10.1063/1.3103553
关键词:
摘要: Pb(Zr,Ti)O3 (PZT)-based ternary compound thin films, 0.06PMnN-0.94PZT(50/50) (PMnN-PZT), are deposited on Si-based heterostructures by rf magnetron sputtering system. The intrinsic PZT(50/50) films also the same kind of substrates for comparison. PMnN-PZT show similar polycrystalline structures as those PZT with highly (111) oriented perovskite phase. excellent piezoelectricity and ferroelectricity which distinctly better than prepared deposition conditions. Besides, cantilevers heterostructure exhibit higher sensitivities film cantilevers.