作者: T.V. Torchynska , A. Díaz Cano , S. Jiménez Sandoval , M. Dybic , S. Ostapenko
DOI: 10.1016/J.MEJO.2005.02.116
关键词:
摘要: … SiC characterization using photoluminescence, Raman … spectroscopy study on bulk SiC and porous SiC layers has shown … eV in the porous SiC layer can be attributed to defect related …