Method for quickly quantifying the resistance of a thin film as a function of frequency
作者： Aaron D. Lazarus , Wayne C. Jones
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摘要: The present invention provides a baseline function, viz., transmission-related parameter (transmission loss, transmission coefficient, etc.) as function of resistance uniformly resistant finitely thin film—which is predicated on the theoretical behavior electromagnetic radiation passing through infinitely film. This characterized by constancy for any frequency radiation, wherein each value has associated therewith constant parameter. formed calculating plural values in model. correlated with an empirical radiation—which formed, testing, measuring values. correlation yields functional relationship between and frequency.
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