The Ellipsometer, an Apparatus to Measure Thicknesses of Thin Surface Films
作者： Alexandre Rothen
DOI: 10.1063/1.1770315
关键词:
摘要: An apparatus designed to determine the thickness of films deposited on metal slides is described. It is based on the measurement of the change that takes place in ellipticity of the light …
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sci-hub.se 参考文章(4)
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