On the Location of Boron in SiO2‐embedded Si Nanocrystals – An X‐ray Absorption Spectroscopy and Density Functional Theory Study

作者: Stefan Schuppler , Daniel Hiller , Daniel Hiller , Peter Nagel , Sean C. Smith

DOI: 10.1002/PSSB.202000623

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参考文章(47)
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