Structural characterization and 90° domain contribution to ferroelectricity of epitaxial Pb(Zr0.35,Ti0.65)O3 thin films
作者： Keisuke Saito , Toshiyuki Kurosawa , Takao Akai , Takahiro Oikawa , Hiroshi Funakubo
DOI: 10.1063/1.1530727
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摘要: Remanent polarizations (Pr) of 200-nm-thick epitaxial Pb(Zr0.35,Ti0.65)O3 (PZT) thin films deposited on (001), (110), and (111) SrTiO3 (STO) substrates coated with SrRuO3 (SRO) were compared to the domain configurations that precisely quantitatively characterized by high-resolution x-ray diffraction reciprocal space mapping (HRXRD-RSM). (001)/(100), (101)/(110), oriented domains obtained for grown STO SRO, respectively. HRXRD-RSM showed (001) (110) mainly consisted (101) domains, although they also included about 32% 25% (100) domain, Tilt growths in found except domain. The tilt (100), (101), attributed geometrically induced 90° had {101} walls. On other hand, was misfit strain relaxat...
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