Origin of preferential orthorhombic twinning in SrRuO3 epitaxial thin films
作者： Jon-Paul Maria , H. L. McKinstry , S. Trolier-McKinstry
DOI: 10.1063/1.126654
关键词: Tetragonal crystal system 、 Ruthenium Compounds 、 Crystal twinning 、 Thin film 、 Epitaxial thin film 、 Texture (crystalline) 、 Materials science 、 Crystallography 、 Orthorhombic crystal system 、 Structural phase
摘要: In order to elucidate the driving forces which promote oriented in-plane crystallographic texture in SrRuO3 thin films deposited on stepped SrTiO3 substrates, a high-temperature x-ray analysis of both and powders was conducted. Structural phase transitions were found at temperatures near 350 °C slightly above 600 °C. The are tentatively indexed as orthorhombic tetragonal cubic, respectively. These results suggest that grow with cubic symmetry. As such, film–substrate interfacial characteristics, rather than preferred growth direction, believed determine orientation twins.
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