Carbon-doped single-crystalline SiGe/Si thermistor with high temperature coefficient of resistance and low noise level
作者： H. H. Radamson , M. Kolahdouz , S. Shayestehaminzadeh , A. Afshar Farniya , S. Wissmar
DOI: 10.1063/1.3524211
关键词:
摘要: … The simulations of the fully strained SiGe/Si quantum well structure … and the carbon-doping in the Si barrier layer. 6. T. … The effect of silicidation and carbon-doping ( Si 0.99 C 0.01 barrier …
harvard.edu
scitation.org
aip.org 
sci-hub.se 
researchgate.net 参考文章(8)
F.N. Hooge, 1/ƒ noise is no surface effect Physics Letters A. ,vol. 29, pp. 139- 140 ,(1969) , 10.1016/0375-9601(69)90076-0
M. Kolahdouz, L. Maresca, M. Ostling, D. Riley, R. Wise, H.H. Radamson, New method to calibrate the pattern dependency of selective epitaxy of SiGe layers international sige technology and device meeting. ,vol. 53, pp. 858- 861 ,(2009) , 10.1016/J.SSE.2009.04.018
M. Moreno, A. Kosarev, A. Torres, R. Ambrosio, Fabrication and performance comparison of planar and sandwich structures of micro-bolometers with Ge thermo-sensing layer Thin Solid Films. ,vol. 515, pp. 7607- 7610 ,(2007) , 10.1016/J.TSF.2006.11.172
Yuqiang Lv, Ming Hu, Miao Wu, Zhigang Liu, Preparation of vanadium oxide thin films with high temperature coefficient of resistance by facing targets d.c. reactive sputtering and annealing process Surface & Coatings Technology. ,vol. 201, pp. 4969- 4972 ,(2007) , 10.1016/J.SURFCOAT.2006.07.211
M. Kolahdouz, A. Afshar Farniya, L. Di Benedetto, H. H. Radamson, Improvement of infrared detection using Ge quantum dots multilayer structure Applied Physics Letters. ,vol. 96, pp. 213516- ,(2010) , 10.1063/1.3441120
Chris G. Van de Walle, Richard M. Martin, Theoretical calculations of heterojunction discontinuities in the Si/Ge system. Physical Review B. ,vol. 34, pp. 5621- 5634 ,(1986) , 10.1103/PHYSREVB.34.5621
D. Lienhard, F. Heepmann, B. Ploss, Thin nickel films as absorbers in pyroelectric sensor arrays Microelectronic Engineering. ,vol. 29, pp. 101- 104 ,(1995) , 10.1016/0167-9317(95)00124-7
S.G.E. Wissmar, H.H. Radamsson, Y. Yamamoto, B. Tillack, C. Vieider, J.Y. Andersson, SiGe quantum well thermistor materials Thin Solid Films. ,vol. 517, pp. 337- 339 ,(2008) , 10.1016/J.TSF.2008.08.164