Charge retention behavior of preferentially oriented and textured Bi3.25La0.75Ti3O12 thin films by electrostatic force microscopy
作者： TY Kim , JH Lee , YJ Oh , MR Choi , W Jo
DOI: 10.1063/1.2472181
关键词:
摘要: The authors report charge retention in preferentially (117) oriented and textured c-axis ferroelectric Bi3.25La0.75Ti3O12 thin films by electrostatic force microscopy. Surface charges of the were observed as a function time selected area which consists single-poled region reverse-poled region. highly film shows extended exponential decay with characteristic scaling exponents, n=1.5–1.6. remarkable retained behavior regardless poling. Decay mechanisms regions are explained space-charge redistribution trapping defects films.
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