作者: Jin Soo Hwang , Satoru Tanaka , Sohachi Iwai , Yoshinobu Aoyagi , Seeyearl Seong
DOI: 10.1016/S0022-0248(98)00893-8
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摘要: Abstract High quality GaN films of low etch pit density (10 7 cm −2 ) have been prepared by metal organic chemical vapour deposition (MOCVD) on 6H-SiC substrate with Aln buffer layer. The layer was pretreated alternating pulsative supply (APS) trimethyl gallium (TMG) and NH 3 gases. Nitrogen atom is expected to incorporate into the cluster formed APS process. sizes grains at initial stage increased treatment. photoluminescence spectrum resulting 13 K shows sharp near band-edge emission peak 3.47 eV 12 meV FWHM value. PL intensity donor–acceptor transition 3.26 eV reduced decrease defect density.