A new method to measure silicon lattice spacings and possible new definition of the kilogram: scheme and progress
作者： Wei-Tou Ni , Jia-Ruey Duann , Gwo-Sheng Peng , Hsien-Fen Hsieh , Chung-Ping Lai
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摘要: For possible new definition of the kilogram, we propose to use picometer metrology and AFM continuously scan with atomic resolution a surface strip about 2 nm/spl times/10 mm area on single silicon crystal in 2/spl times/10/sup -11/ torr vacuum chamber measure lattice spacings 0.1-1 ppb. >
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