Calculating the trap density of states in organic field-effect transistors from experiment: A comparison of different methods
作者： Wolfgang L. Kalb , Bertram Batlogg
DOI: 10.1103/PHYSREVB.81.035327
关键词:
摘要: … The spectral density of localized states in the band gap of … Several analytical methods to calculate the trap DOS from the … of 50–60 meV and a trap density at the valence-band edge of≈ …
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