Extended pseudo-Voigt function for approximating the Voigt profile

作者: T. Ida , M. Ando , H. Toraya

DOI: 10.1107/S0021889800010219

关键词:

摘要: … Lorentzian weight of the pseudo-Voigt function are related to the … -Voigt function for precisely approximating the Voigt profile … intensity, Γ G and Γ L , estimated by fitting to a Voigt profile. …

参考文章(9)
William H. Press, Saul A. Teukolsky, Numerical recipes Computers in Physics. ,vol. 4, pp. 669- 672 ,(1990) , 10.1063/1.4822961
G. Hölzer, M. Fritsch, M. Deutsch, J. Härtwig, E. Förster, K α 1 , 2 and K β 1 , 3 x-ray emission lines of the 3 d transition metals Physical Review A. ,vol. 56, pp. 4554- 4568 ,(1997) , 10.1103/PHYSREVA.56.4554
T. Ida, K. Kimura, Effect of sample transparency in powder diffractometry with Bragg–Brentano geometry as a convolution Journal of Applied Crystallography. ,vol. 32, pp. 982- 991 ,(1999) , 10.1107/S0021889899008894
P. Thompson, D. E. Cox, J. B. Hastings, Rietveld refinement of Debye–Scherrer synchrotron X‐ray data from Al2O3 Journal of Applied Crystallography. ,vol. 20, pp. 79- 83 ,(1987) , 10.1107/S0021889887087090
Th. H. de Keijser, J. I. Langford, E. J. Mittemeijer, A. B. P. Vogels, Use of the Voigt function in a single-line method for the analysis of X-ray diffraction line broadening Journal of Applied Crystallography. ,vol. 15, pp. 308- 314 ,(1982) , 10.1107/S0021889882012035
G. P. M. Poppe, C. M. J. Wijers, More efficient computation of the complex error function ACM Transactions on Mathematical Software. ,vol. 16, pp. 38- 46 ,(1990) , 10.1145/77626.77629
W. I. F. David, J. C. Matthewman, Profile refinement of powder diffraction patterns using the Voigt function Journal of Applied Crystallography. ,vol. 18, pp. 461- 466 ,(1985) , 10.1107/S0021889885010718
G. K. Wertheim, M. A. Butler, K. W. West, D. N. E. Buchanan, Determination of the Gaussian and Lorentzian content of experimental line shapes Review of Scientific Instruments. ,vol. 45, pp. 1369- 1371 ,(1974) , 10.1063/1.1686503
L. B. McCusker, R. B. Von Dreele, D. E. Cox, D. Louër, P. Scardi, Rietveld refinement guidelines Journal of Applied Crystallography. ,vol. 32, pp. 36- 50 ,(1999) , 10.1107/S0021889898009856