作者: Nobuyasu Negishi , Ryota Tanaka , Tomonari Nakada , Kazuto Sakemura , Yoshiyuki Okuda
DOI: 10.1116/1.2165667
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摘要: Practical advantages of an advanced high-efficiency electron emission device (HEED) (low-voltage operation, relatively simple structure, and availability for large-area applications) are further confirmed by its compatibility with active-matrix drive configuration. The fabricated HEED array has been applied to a high-sensitivity image sensing tube target high-gain avalanche rushing amorphous photoconductor (HARP). It is demonstrated that prototype 256×192pixel operates well as effective probe high-resolution pickup in combination HARP target. promising development next-generation sensor ultrahigh sensitivity high definition.