Time-Resolved Photoluminescence Microscopy for the Analysis of Semiconductor-Based Paint Layers.

摘要: In conservation, science semiconductors occur as the constituent matter of so-called semiconductor pigments, produced following Industrial Revolution and extensively used by modern painters. With recent research highlighting occurrence various degradation phenomena in paints, it is clear that their detection conventional optical fluorescence imaging microscopy limited complexity historical painting materials. Here, we illustrate prove capabilities time-resolved photoluminescence (TRPL) microscopy, equipped with both spectral lifetime sensitivity at timescales ranging from nanoseconds to hundreds microseconds, for analysis cross-sections paint layers made luminescent pigments. The method sensitive heterogeneities within micro-samples provides valuable information interpretation nature emissions samples. A case study presented on micro samples a Henri Matisse serves demonstrate how TRPL can be identify pigments zinc white cadmium yellow, inform future investigations yellow paint.