Elemental and bond mapping of complex nanostructures by MLS analysis of EELS spectrum-imaging data

摘要: The huge and increasing interest in nano-structures has stimulated the development of appropriate characterisation methods order better to understand (and thus exploit) their properties possible applications. Electron Energy Loss Spectroscopy (EELS) is an exceptionally useful analytical technique this regard. In particular, spectrumimaging (SPIM) mode [1], which retains full energy spatial resolution technique, permits mapping a material’s electronic at less than 1 nm [2].