Study of single-electron excitations by electron microscopy I. Image contrast from delocalized excitations
作者： A. J. Craven , J. M. Gibson , A. Howie , D. R. Spalding
DOI: 10.1080/01418617808239251
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摘要: Abstract The inelastic scattering of fast electrons by the excitation L-shell at a stacking fault in silicon has been studied with scanning transmission electron microscope. It was f...
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