作者: J.G. Lu , L.P. Zhu , Z.Z. Ye , F. Zhuge , Y.J. Zeng
DOI: 10.1016/J.APSUSC.2004.09.112
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摘要: Abstract N–Al codoped p-type ZnO thin films have been realized by dc reactive magnetron sputtering in N2O ambient. Hall measurement, X-ray photoelectron spectroscopy, diffraction and optical transmission were carried out to investigate the effect of growth temperature on properties films. Results indicated that with good structural, electrical can only be obtained at an intermediate region (e.g., 500 °C). The had lowest resistivity 57.3 Ω cm, a carrier concentration up 2.52 × 1017 cm−3. In addition, film deposited 500 °C was crystallinity (0 0 2) preferential orientation, high transmittance about 90% visible region.