作者: Adam D. Downey , Timothy P. Hogan , Bruce Cook
DOI: 10.1063/1.2775432
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摘要: This article describes a new measurement technique that utilizes impedance spectroscopy for the characterization of thermoelectric materials and devices. Two circuit models were developed used to help explain data using transmission line theory coupled electrothermal model. testing configurations have been investigated including one based on sinusoidal source (ac lock-in technique) pulsed wave source. Methods reducing times this are discussed. In addition, influence radiation losses has also analyzed further understand limitations at higher temperatures.