作者: M. M. Eddy , J. Z. Sun , R. D. Hammond , L. Drabeck , I. B. Ferreira
DOI: 10.1063/1.350257
关键词:
摘要: We have measured the surface resistance Rs of laser‐deposited Tl2Ba2CaCu2O8 thin films on LaAlO3 substrates. After correcting for leakage radiation through films, we find that normalized Rs/RN (with RN normal‐state at T ≥ Tc) is comparable to YBa2Cu3O7 (123) films. The higher transition temperature Tl leads superior microwave performance in particular temperatures around T=77 K and above.