作者: Amin Hamidian , Viswanathan Subramanian , Ran Shu , Andrea Malignaggi , Georg Boeck
DOI: 10.1109/IMWS3.2011.6061851
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摘要: This paper presents the extraction techniques of RF feeding structures for accurate modeling on-chip passive and active components. The presented have been applied a group test realized in 90 nm CMOS process validated through measurements up to 100 GHz. Feeding comprising probing pads, pad transmission line transition short 50 Ω lines modeled with help electromagnetic simulations. utilized components like MIM capacitors, transistors etc., from measurements. comparisons between foundry based models extracted results show good accuracy validating GHz operating frequencies.