Chemical mechanical polishing composition and process

作者: Maria Louise Peterson , David John Maloney , Laurence Mcghee , Robert J. Small

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摘要: A composition for chemical mechanical polishing includes a slurry. sufficient amount of selectively oxidizing and reducing compound is provided in the to produce differential removal metal dielectric material. pH adjusting adjusts provide that makes improved by including an effective hydroxylamine compound, ammonium persulfate, which indirect source hydrogen peroxide, peracetic acid or periodic acid. method comprises applying slurry material surface applied The adjusted material,

参考文章(38)
Norvell J. Nelson, Nickel etching process and solution ,(1984)
Christopher C. Streinz, Michael A. Lucarelli, Brian L. Mueller, Max H. Walters, Fluoride additive containing chemical mechanical polishing slurry and method for use of same ,(1997)
Yaw Samuel Obeng, Method of polishing ,(1996)
Russell S Banush, Donald P Hagerty, Dissolution of metal with acidified hydrogen peroxide solutions ,(1966)
Jayashree Kalpathy-Cramer, Ronald A. Carpio, Rahul Jairath, Slurry formulation for chemical mechanical polishing of metals ,(1996)
Vlasta Brusic Kaufman, Shumin Wang, Multi-oxidizer slurry for chemical mechanical polishing ,(1997)