Total reflection X-ray fluorescence analysis with polarized X-rays, a compact attachment unit, and high energy X-rays
作者： Peter wobrauschek , Peter kregsamer
DOI: 10.1016/0584-8547(89)80050-3
关键词:
摘要: Abstract Excitation of samples in total reflection geometry using energy-dispersive spectrometer systems (TXRF) for the detection characteristic X-rays has shown to be a very efficient technique. Limits (LD) at ng ml or pg-level, absolute mass, are attainable. Three approaches presented: use linearly polarized after Bragg through 90° as excitation source reflection, stable easily mountable TXRF unit standard laboratory equipment, and development experiment high-energy primary radiation up 100 keV K-series high Z elements, which preliminary results given.
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