作者: Sinem Aydemir
DOI: 10.1016/J.VACUUM.2015.05.041
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摘要: Abstract Nanocrystalline Al-doped ZnO (AZO) thin films were deposited on glass substrates by using sol–gel dip coating technique at different withdrawal speeds (WS: 20, 40 and 80 mm/min). The effects of WS the crystalline structure, morphology optical properties obtained extensively investigated a series characterization techniques, including X-ray diffraction (XRD), atomic force microscopy (AFM), scanning electron (SEM), photoluminescence (PL). It was found that, significantly affects films. XRD analysis confirmed that are polycrystalline in nature having hexagonal crystal structure with preferred grain orientations along (100), (002) (101) directions. SEM AFM observations indicate smooth surface small rounded grains. band-gap energy ( E g ) evaluated as 3.20–3.27 eV, which increased increasing rate. At room temperature, observed from AZO origin emission discussed.