Influence of surface migration on the spatial resolution of pulsed laser atom probe tomography
作者： B. Gault , M. Müller , A. La Fontaine , M. P. Moody , A. Shariq
DOI: 10.1063/1.3462399
关键词:
摘要: The impact of laser pulsing on the field evaporation process is investigated for Al and W by pulsed atom probe tomography. Quantitative analysis reveals influence spatial resolution peak temperature reached specimen following light absorption from pulse. It concluded that surface migration processes induce significant degradation lateral resolution, changing 100% 20%, respectively, when increased 4% to 7% material’s melting point, while in-depth shown remain nearly constant both materials.
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