Chemical bonding effects in X-ray spectral analysis
作者： L. N. Mazalov , B. A. Treiger
DOI: 10.1007/BF00747393
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摘要:
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sci-hub.se 参考文章(113)
J. W. Colby, Quantitative Microprobe Analysis of Thin Insulating Films Advances in x-ray analysis. ,vol. 11, pp. 287- 305 ,(1967) , 10.1154/S0376030800004924
M. Grasserbauer, H. Drack, H. Malissa, Zur verbindungsspezifischen Lokalanalyse mit der Mikrosonde: Systematische Untersuchungen von Spektrenparametern zur Charakterisierung der Röntgenvalenzbandspektren Mikrochimica Acta. ,vol. 71, pp. 29- 46 ,(1979) , 10.1007/BF01197517
Helmut Oppolzer, Eckhard Wolfgang, A New Method of Electron-Probe Microanalysis for Determining the Degree of Oxidation in Silicon Oxides Springer, Vienna. pp. 311- 319 ,(1975) , 10.1007/978-3-7091-8422-6_22
Frederick Vratny, Insulation Division, Thin film dielectrics Dielectrics and Insulation Division, Electrochemical Society. ,(1969)
C. N. R. Rao, John R. Ferraro, Carl Johan Ballhausen, Spectroscopy in inorganic chemistry. ,(1970)
Harvey Yakowitz, Joseph Goldstein, Practical scanning electron microscopy : electron and ion microprobe analysis Plenum Press. ,(1975)
Naoki Saitou, Yohichi Gohshi, Deconvolution of Iron K β1,3 Spectra Fitted with Spline Functions Japanese Journal of Applied Physics. ,vol. 20, pp. 1767- 1768 ,(1981) , 10.1143/JJAP.20.1767
Yukiya Horikawa, Hiroyoshi Soezima, STATE ANALYSIS OF IRON IN ALLOPHANIC CLAYS. II. IRON L-EMISSION BAND SPECTRA FROM ALLOPHANIC CLAYS AND HISINGERITE BY THE USE OF AN X-RAY MICROANALYZER Clay science. ,vol. 5, pp. 97- 102 ,(1977) , 10.11362/JCSSJCLAYSCIENCE1960.5.97
J. Zussman, Physical methods in determinative mineralogy ,(1967)
Manfred Grasserbauer, Die Bedeutung der Valenzbandspektren in der Elektronenstrahl-Mikroanalyse. V Mikrochimica Acta. ,vol. 64, pp. 69- 75 ,(1975) , 10.1007/BF01220988