Hard X Ray Holographic Diffraction Imaging

摘要: We determine the absolute electron density of a lithographically grown nanostructure with 25 nm resolution by combining hard x-ray Fourier transform holography iterative phase retrieval methods. While immediately reveals an unambiguous image object, we deploy in addition algorithms for pushing close to diffraction limit. The use (8 keV) x rays eliminates practically all constraints on sample environment and enables destruction-free investigation relatively thick or buried samples, making holographic imaging very attractive tool materials science. note that technique is ideally suited subpicosecond will become possible emerging free-electron lasers.