Evaluation of electrically polar substances by electric scanning force microscopy. Part I: Measurement signals due to maxwell stress
作者： K. Franke , M. Weihnacht
DOI: 10.1080/07315179508205938
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摘要: Abstract The electric scanning force microscope (EFM) is used for the high-resolution characterization of electrically polar substances. An EFM considered, tip which conductive and has a given potential. exposed to Maxwell stress caused by ferroelectric domains sample permittivity. This analytically calculated in one-dimensional model. results calculation are compared with measurements. method measuring particular discussed.
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