Semiconductor device including dual spacer and uniform epitaxial buffer interface of embedded SiGe source/drain

作者: Veeraraghavan S. Basker , Chun-Chen Yeh , Tenko Yamashita , Zuoguang Liu

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摘要: A semiconductor device includes at least one fin on an upper surface of a substrate. The channel region formed first material interposed between opposing embedded source/drain regions second different from the material. At gate stack is substrate and wraps around region. have symmetrical shape uniform interface.

参考文章(15)
Alexander Reznicek, Judson Robert Holt, Eric C. Harley, Thomas N. Adam, Multigate finFETs with epitaxially-grown merged source/drains ,(2012)
Philip J. Oldiges, Christy S. Tyberg, Ghavam G. Shahidi, Elbert E. Huang, Xinlin Wang, Robert L. Wisnieff, MOSFET structure with ultra-low K spacer ,(2005)
Ali Khakifirooz, Bruce B. Doris, Pranita Kulkarni, Kangguo Cheng, Ghavam G. Shahidi, Stressed Fin-FET devices with low contact resistance ,(2012)
Daniel Tang, Tzu-Shih Yen, Replacement source/drain finfet fabrication ,(2012)
Reinaldo A. Vega, Tsu-Jae King Liu, Three-Dimensional FinFET Source/Drain and Contact Design Optimization Study IEEE Transactions on Electron Devices. ,vol. 56, pp. 1483- 1492 ,(2009) , 10.1109/TED.2009.2021439
Uday Shah, Rajwinder Singh, Willy Rachmady, Jack T. Kavalieros, Method of forming a selective spacer in a semiconductor device ,(2006)