Relationship between Mobilities from Time-of-Flight and Dark-Injection Space-Charge-Limited Current Measurements for Organic Semiconductors: A Monte Carlo Study
作者： Haoyuan Li , Lian Duan , Deqiang Zhang , Guifang Dong , Juan Qiao
DOI: 10.1021/JP411948D
关键词:
摘要: The dark-injection space-charge-limited current (DI-SCLC) and the time-of-flight (TOF) measurements are both widely used methods to obtain the charge mobilities of organic …
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