作者: Bradley H Frazer , Marco Girasole , Lisa M Wiese , Torsten Franz , Gelsomina De Stasio
DOI: 10.1016/J.ULTRAMIC.2003.10.001
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摘要: Several X-ray PhotoElectron Emission spectroMicroscopes (X-PEEMs) exist around the world at this time. We present recent performance and resolution tests of one them, Spectromicroscope for PHotoelectron Imaging Nanostructures with X-rays (SPHINX) X-PEEM, installed University Wisconsin Synchrotron Radiation Center. With state-of-the-art instrument we demonstrate chemical analysis capabilities on conducting insulating specimens diverse interests, an unprecedented lateral 10 nm monochromatic 7.2 ultraviolet illumination.