Effects of adsorbed water layer structure on adhesion force of silicon oxide nanoasperity contact in humid ambient
作者： David B. Asay , Seong H. Kim
DOI: 10.1063/1.2192510
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摘要: The origin of the large relative-humidity (RH) dependence adhesion force in single-asperity contact between silicon oxide surfaces is elucidated. As RH increases, measured with an atomic microscopy (AFM) initially reaches a maximum, and then decreases at high RH. capillary alone cannot explain observed magnitude dependence. due to presence icelike structured water adsorbed surface room temperature. A solid-adsorbate-solid model developed calculating contributions from forces, van der Waals interactions, rupture ice-ice bridge center region. This illustrates how structure, thickness, viscoelastic behavior layer influence nanoasperity contact.
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