作者: D. Marchand , C. Fretigny , M. Lagues , A.P. Legrand , E. McRae
DOI: 10.1016/0008-6223(84)90082-4
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摘要: The importance of both the crystallographic and chemical characterization graphite substrate is discussed as regards an understanding intercalation. influence defects on transport properties synthetic metals recalled. Low energy electron diffraction (LEED) Auger spectroscopy (AES) are suitable tools for estimating mean size crystallites determining possible surface contamination. After a description cleaning procedure surfaces, we show that deposition cesium, followed by thermal diffusion, leads to clear revelation crystallite boundaries. Graphite substrates various origin quality submitted AES LEED. Purity structure compared. electrical conductivity, parallel perpendicular layer planes, has been measured. results in relation size. No correlation found between this parameter dispersion c-axes determined X-ray diffraction.