Time-of-flight SIMS and in-situ XPS study of O2 and O2-N2 post-discharge microwave plasma-modified high-density polyethylene and hexatriacontane surfaces

作者: D. Leonard , P. Bertrand , A. Scheuer , R. Prat , J. Hommet

DOI: 10.1163/156856196X00184

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摘要: The O-2 and O-2-N-2 ([N-2] < 15%) post-discharge microwave plasma modifications of high-density polyethylene (HDPE) hexatriacontane (HTC) surfaces have been studied as a function the distance from discharge gas composition. They are compared in terms in-situ XPS O/C ratios C1s components, ex-situ ToF-SIMS O-/CH- relative intensities series peaks. results on effect showed clear correlation between modeling, exhibiting double role oxygen atoms: functionalization initialization by creating radicals (which react with molecular oxygen) degradation due to energy released atom recombination process. Specific signatures this related process were exhibited. When N-2 was introduced gas, very different. decreased addition exhibited high maximum fdr 5% N-2-95% then decreased. Despite absence complete it can be assumed that there is also content for postdischarge. Thanks specific signatures, shown corresponds low effect. Nitrogen introduction could influence atoms such way decrease processes (thus degradation) small even further incorporation gas. No nitrogen observed results, whereas some nitrogen-containing ions post-discharge. However, their followed variation oxidation not concentration post-treatment Differences HDPE HTC explained structural differences (desorption weight oxygen-containing fragments HTC).

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