Self-calibration circuit and method for junction temperature estimation
作者： Benoit Bataillou , Pascal Bancken , Radu Surdeanu , Viet Nguyen Hoang , David Van Steenwinckel
DOI:
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摘要: The present invention relates to a calibration circuit, computer program product, and method of calibrating junction temperature measurement semiconductor element, wherein respective forward voltages at junctions the element reference sensor are measured, an absolute ambient is determined by using sensor, predicted based on measured voltages.
lens.org 参考文章(9)
Kelvin Shih, LED junction temperature tester ,(2003)
Benoit Bataillou, Pascal Bancken, Radu Surdeanu, Hoang Viet Nguyen, Steenwinckel David Van, System and method for estimating the junction temperature of a light emitting diode ,(2009)
Heiko Koerner, Apparatus and method for providing a temperature dependent output signal ,(2006)
Torsten Klemm, Gunther Bergk, Method and circuit for measuring a voltage or a temperature and for generating a voltage with any predeterminable temperature dependence ,(2001)
William N. Schnaitter, System for on-chip temperature measurement in integrated circuits ,(2011)
Mehmet Aslan, Sumer Can, Direct temperature sensing of a semiconductor device semiconductor device ,(1997)
Patel Mohnish Kumar, An LED based temperature sensor ,(2002)
Tadashi Yamamoto, Mfg. method of airbag outer shell ,(2001)