Nanoindentation deformation and cracking in sapphire
作者： V. Trabadelo , S. Pathak , F. Saeidi , M. Parlinska-Wojtan , K. Wasmer
DOI: 10.1016/J.CERAMINT.2019.02.022
关键词:
摘要: … the subsurface damages after indentations. The TEM samples were fabricated by cross sectioning the indent using the Focused Ion Beam (FIB) in a FEI Strata DB 235 equipment. …
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