Electromagnetic and microstructural characterization of YBa2Cu3O7 step edge junctions on (001) LaAlO3 substrates
作者： H. R. Yi , M. Gustafsson , D. Winkler , E. Olsson , T. Claeson
DOI: 10.1063/1.362594
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摘要: Sharp and straight step edges on (001) LaAlO3 (LAO) substrates were ion milled by using an electron beam defined amorphous carbon thin film mask. YBa2Cu3O7 (YBCO) films patterned to narrow strips across the gave high quality Josephson junctions. Their current–voltage (I–V) curves could be well described resistively shunted junction model with or without excess current. By varying YBCO thickness over a fixed height, critical current density (jc) of changed several orders magnitude. For junctions jc, typical IcRn (product normal resistance) values around 100 μV at 77 K more than 1 mV 4.2 obtained. Some was observed. low dependence Ic applied magnetic field strong even temperatures. The showed main peak in center well‐defined periods as function field. minimum value suppressed magn...
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