The effect of annealing on the structure and dielectric properties of BaxSr1−xTiO3 ferroelectric thin films
作者： L. A. Knauss , J. M. Pond , J. S. Horwitz , D. B. Chrisey , C. H. Mueller
DOI: 10.1063/1.118106
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摘要: … tetragonal to orthorhombic with decreasing temperature.After annealing the films … dielectric properties. Figure 4 shows the capacitance and dissipation factor as a function of temperature …
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