Stress analysis and ferroelectric properties of Pb(Zr0.52Ti0.48)0.96Nb0.04O3 thin film grown on different thickness of BaPbO3 electrodes

作者: Xin-Yi Wen , Jun Yu , Yun-Bo Wang , Wen-Li Zhou , Jun-Xiong Gao

DOI: 10.1063/1.3518516

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摘要: Pb ( Zr 0.52 Ti 0.48 ) 0.96 Nb 0.04 O 3 (PZTN) thin films were deposited on BaPbO 3 (BPO) electrodes by rf-magnetron sputtering. 34, 68, 135, and 270 nm thick BPOs were adopted in …

参考文章(38)
S. Aggarwal, I. G. Jenkins, B. Nagaraj, C. J. Kerr, C. Canedy, R. Ramesh, G. Velasquez, L. Boyer, J. T. Evans, Switching properties of Pb(Nb, Zr, Ti)O3 capacitors using SrRuO3 electrodes Applied Physics Letters. ,vol. 75, pp. 1787- 1789 ,(1999) , 10.1063/1.124820
Ningdong Huang, Zhirong Liu, Zhongqing Wu, Jian Wu, Wenhui Duan, Bing-Lin Gu, Xiao-Wen Zhang, Huge Enhancement of Electromechanical Responses in Compositionally ModulatedPb(Zr1−x Tix)O3 Physical Review Letters. ,vol. 91, pp. 067602- 067602 ,(2003) , 10.1103/PHYSREVLETT.91.067602
N. A. Pertsev, V. G. Kukhar, H. Kohlstedt, R. Waser, Phase diagrams and physical properties of single-domain epitaxial Pb ( Zr 1 − x Ti x ) O 3 thin films Physical Review B. ,vol. 67, pp. 054107- ,(2003) , 10.1103/PHYSREVB.67.054107
Ragini, Rajeev Ranjan, SK Mishra, Dhananjai Pandey, None, Room temperature structure of Pb(ZrxTi1−xO3) around the morphotropic phase boundary region: A Rietveld study Journal of Applied Physics. ,vol. 92, pp. 3266- 3274 ,(2002) , 10.1063/1.1483921
Chun-Sheng Liang, Jenn-Ming Wu, Ming-Chu Chang, Ferroelectric BaPbO3/PbZr0.53Ti0.47/BaPbO3 heterostructures Applied Physics Letters. ,vol. 81, pp. 3624- 3626 ,(2002) , 10.1063/1.1520332
Li Yan, Jiefang Li, Hu Cao, D. Viehland, Low symmetry phase in Pb(Zr0.52Ti0.48)O3 epitaxial thin films with enhanced ferroelectric properties Applied Physics Letters. ,vol. 89, pp. 262905- ,(2006) , 10.1063/1.2425016
S. Y. Kweon, S. H. Yi, S. K. Choi, Intrinsic stress dependence of c-axis orientation ratio in PbTiO3 thin films deposited by reactive sputtering Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. ,vol. 15, pp. 57- 61 ,(1997) , 10.1116/1.580476
R. Ramesh, W. K. Chan, B. Wilkens, H. Gilchrist, T. Sands, J. M. Tarascon, V. G. Keramidas, D. K. Fork, J. Lee, A. Safari, Fatigue and retention in ferroelectric Y‐Ba‐Cu‐O/Pb‐Zr‐Ti‐O/Y‐Ba‐Cu‐O heterostructures Applied Physics Letters. ,vol. 61, pp. 1537- 1539 ,(1992) , 10.1063/1.107488
Muhtar Ahart, Maddury Somayazulu, R. E. Cohen, P. Ganesh, Przemyslaw Dera, Ho-kwang Mao, Russell J. Hemley, Yang Ren, Peter Liermann, Zhigang Wu, Origin of morphotropic phase boundaries in ferroelectrics Nature. ,vol. 451, pp. 545- 548 ,(2008) , 10.1038/NATURE06459
N. A. Pertsev, A. G. Zembilgotov, A. K. Tagantsev, Effect of Mechanical Boundary Conditions on Phase Diagrams of Epitaxial Ferroelectric Thin Films Physical Review Letters. ,vol. 80, pp. 1988- 1991 ,(1998) , 10.1103/PHYSREVLETT.80.1988