The contribution of phonon scattering to high-resolution images measured by off-axis electron holography.
作者： C.B Boothroyd , R.E Dunin-Borkowski
DOI: 10.1016/J.ULTRAMIC.2003.08.005
关键词:
摘要: The contribution of electrons that have been phonon scattered to the lattice fringe amplitude and background intensity a high-resolution electron microscope (HREM) image is addressed experimentally through analysis defocus series energy-filtered off-axis holograms. It shown at typical specimen thickness used for HREM imaging approximately 15% contribute an scattered. At this thickness, phonon-scattered opposite contrast elastic image. overall then reduced 70% value it would in absence scattering. higher behaviour defocus-dependent, with having either same or sense as varied.
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